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Record Nr. |
UNISA996204469603316 |
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Titolo |
1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995 |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Electron Devices Society, 1996 |
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Disciplina |
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Soggetti |
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Integrated circuits - Congresses - Reliability |
Integrated circuits - Reliability - Wafer scale integration - Congresses |
Electrical & Computer Engineering |
Electrical Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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