The IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : proceedings : Chicago, Illinois, 7-9 October 2009 / / edited by Dimitris Gizopoulos, Mohammad Tehranipoor, and Spyros Tragoudas ; sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, the IEEE Test Technology Technical Council

• Record Nr.: UNISA996203025203316
• Pubbl/distr/stampa: New York : , : IEEE, , 2009
• ISBN: 1-5090-7533-X
• Descrizione fisica: 1 online resource (xxxi, 455 pages)
• Soggetti: Fault-tolerant computing; Integrated circuits - Very large scale integration - Design and construction
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Includes index.