2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003

• Record Nr.: UNISA996202927503316
• Pubbl/distr/stampa: [Place of publication not identified], : IEEE Society, 2003
• Disciplina: 621.3815
• Soggetti: Integrated circuits - Reliability; Integrated circuits - Reliability - Wafer-scale integration; Electrical & Computer Engineering; Engineering & Applied Sciences; Electrical Engineering
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Bibliographic Level Mode of Issuance: Monograph