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Record Nr. |
UNISA996202483603316 |
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Titolo |
Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2003 |
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Disciplina |
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Soggetti |
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Integrated circuits - Defects |
Integrated circuits - Testing |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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