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Record Nr. |
UNISA996202254303316 |
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Titolo |
6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Computer Society, 2005 |
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ISBN |
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Disciplina |
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Soggetti |
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Integrated circuits - Reliability - Very large scale integration |
Integrated circuits - Very large scale integration - Design and construction |
Integrated circuits - Very large scale integration - Computer-aided design |
Integrated circuits - Very large scale integration - Testing - Quality control |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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