1.
Record Nr.
UNISA996199631103316
Titolo
1999 4th International Workshop on Statistical Metrology
Pubbl/distr/stampa
[Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999
Disciplina
621.3815/2/0287
Soggetti
Semiconductors - Characterization - Statistical methods
Semiconductors - Measurement
Electrical Engineering
Electrical & Computer Engineering
Engineering & Applied Sciences
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Note generali
Bibliographic Level Mode of Issuance: Monograph