Simulation-based functional test generation for embedded processors,"C. -- Scalable defect mapping and configuration of memory-based nanofabrics,"Chen -- Improvement of fault injection techniques based on VHDL code modification,"J. -- MVP: a mutation-based validation paradigm,"J. -- Establishing latch correspondence for embedded circuits of PowerPC microprocessors,"H. -- Sequential equivalence checking based on k-th invariants and circuit SAT solving,"Feng -- VERISEC: verifying equivalence of sequential circuits using SAT,"M. -- Automated clock inference for stream function-based system level specifications,"J. -- Cosimulation of ITRON-based embedded software with SystemC,"S. -- A software test program generator for verifying system-on-chips,"A. -- Stimulus generation for interface protocol verification using the nondeterministic extended finite state machine model,"Che-Hua -- DVGen: a test generator for the transmeta Efficeon VLIW processor,"K. -- Reuse in system-level stimuli-generation,"Y. -- Harnessing machine learning to improve the success rate of stimuli generation,"S. -- A new simulation-based property checking algorithm based on partitioned alternative search space traversal,"Qingwei -- Validating families of latency insensitive protocols,"S. -- GASIM: a fast Galois field based simulator for functional model,"D. -- Overlap reduction in symbolic system traversal,"P. -- Formal verification of high-level conformance with symbolic simulation,"R. -- A method for generation of GSTE assertion graphs,"E. -- Automatic abstraction refinement for Petri nets verification,"Zhenyu -- An optimum algorithm |