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1. |
Record Nr. |
UNISA996466279203316 |
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Titolo |
Software Process and Product Measurement [[electronic resource] ] : International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings / / edited by Alain Abran, René Braungarten, Reiner R. Dumke, Juan J. Cuadrado-Gallego, Jacob Brunekreef |
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Pubbl/distr/stampa |
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Berlin, Heidelberg : , : Springer Berlin Heidelberg : , : Imprint : Springer, , 2009 |
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ISBN |
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Edizione |
[1st ed. 2009.] |
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Descrizione fisica |
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1 online resource (XIII, 347 p.) |
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Collana |
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Programming and Software Engineering ; ; 5891 |
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Classificazione |
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Disciplina |
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Soggetti |
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Software engineering |
Computers |
Architecture, Computer |
Computer system failures |
Computer programming |
Software Engineering |
Software Engineering/Programming and Operating Systems |
Theory of Computation |
Computer System Implementation |
System Performance and Evaluation |
Programming Techniques |
Amsterdam (2009) |
Kongress. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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International conference proceedings. |
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Nota di contenuto |
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IWSM / Mensura 2009 Proceedings -- Ensuring Reliability of Information Provided by Measurement Systems -- Analysis of the Functional Size Measurement Methods Usage by Polish Business Software Systems Providers -- Leveraging People-Related Maturity Issues for Achieving Higher Maturity and Capability Levels -- A General |
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Model for Measurement Improvement -- What Are the Significant Cost Drivers for COSMIC Functional Size Based Effort Estimation? -- Analysis of the Risk Assessment Methods – A Survey -- Cockpit Based Management Architectures -- A Case Study in COSMIC Functional Size Measurement: The Rice Cooker Revisited -- Functional Size of a Real-Time System -- A Prototypical Simulation Model to Analyze the Business Process Performance -- Improvement Opportunities and Suggestions for Benchmarking -- Functional Size Measurement Quality Challenges for Inexperienced Measurers -- Applying Test Case Metrics in a Tool Supported Iterative Architecture and Code Improvement Process -- Towards an Early Software Effort Estimation Based on Functional and Non-Functional Requirements -- Formalization Studies in Functional Size Measurement: How Do They Help? -- Using Models to Develop Measurement Systems: A Method and Its Industrial Use -- Evaluating Process Quality Based on Change Request Data – An Empirical Study of the Eclipse Project -- Empirical Evaluation of Hunk Metrics as Bug Predictors -- Using Support Vector Regression for Web Development Effort Estimation -- A Comparison of Neural Network Model and Regression Model Approaches Based on Sub-functional Components -- Formal Definition of Measures for BPMN Models -- Using Tabu Search to Estimate Software Development Effort -- An Experimental Study on the Reliability of COSMIC Measurement Results -- Assessing the Documentation Development Effort in Software Projects. |
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Sommario/riassunto |
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This book constitutes the refereed proceedings of two joint events - the International Workshop on Software Measurement, IWSM 2009 and the International Conference on Software Process and Product Measurement, Mensura 2009, held in Amsterdam, The Netherlands, in November 2009. The 24 revised full papers presented were carefully reviewed and selected from numerous submissions for inclusion in the book. This book considers issues such as the applicability of measures and metrics to software, the efficiency of measurement programs in industry and the theoretical foundations of software engineering. |
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2. |
Record Nr. |
UNINA9910135988603321 |
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Titolo |
IEEE Standard Terminology for Semiconductor Memory / / Institute of Electrical and Electronics Engineers (IEEE) |
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Pubbl/distr/stampa |
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New York : , : Institute of Electrical and Electronics Engineers (IEEE), , 1992 |
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ISBN |
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Descrizione fisica |
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Disciplina |
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Soggetti |
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Standardization |
Terminology |
Product design |
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Lingua di pubblicazione |
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Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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Guidelines under which data sheets for new semiconductor memories are to be generated are provided. Adherence to these guidelines is intended to produce data sheets that are concise and that consistently define the operation and characteristics of semiconductor memory devices. Terminology relevant to product description, product specification, and user information is covered. |
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3. |
Record Nr. |
UNIORUON00084032 |
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Autore |
WALTERS, C.C. |
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Titolo |
An elementary coptic grammar of the sahidic dialect / by C.C. Walters |
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Pubbl/distr/stampa |
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Oxford, : B.H. Blackwell, 1972 |
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Descrizione fisica |
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Disciplina |
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Soggetti |
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Lingua copta - Grammatica |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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