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Record Nr. |
UNINA9911070616503321 |
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Autore |
Hwang Chi-Hung |
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Titolo |
Advancement of Optical Methods and Digital Image Correlation in Experimental Mechanics, Volume 2 : Proceedings of the 2025 Annual Conference on Experimental and Applied Mechanics |
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Pubbl/distr/stampa |
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Milton : , : River Publishers, , 2026 |
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©2026 |
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ISBN |
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87-438-0853-0 |
87-438-0843-3 |
87-438-0848-4 |
87-438-0833-6 |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (82 pages) |
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Soggetti |
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COMPUTERS / Optical Data Processing |
SCIENCE / Mechanics / General |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Cover -- Series Page -- Title Page -- Copyright Page -- Preface -- Table of Contents -- 1 Experimental and Numerical Analysis of Buckling in Welded Rail Systems -- 2 An in-situ Grain-resolved Study of FCC Nickel Plasticity over Gross Granular Fields using Digital Image Correlation with High Resolution Optical Microscopy -- 3 Residual Stress Evaluation in Silicon Wafer Based on the Principle of Superposition and Full-Field Warpage Measurement -- 4 GPU-Accelerated Triangulation in the Stereo-DIC Algorithm Using a Heterogeneous Framework -- 5 A Sublimation-based Pattern Generation Technique for Deformation Analysis of Additively Manufactured Specimens -- 6 Deformation Measurement of Structure Using Sampling Moire Method with SfM-MVS -- 7 Development of an in-situ Sensor for Real-time Geometrical Inspection in Additive Manufacturing -- 8 Development of Mixed Reality Methods for Immersive Visualization of 3D Dynamic Optical Testing Measurements -- 9 Development of an Instantaneous Phase-shifting Lensless Digital Holographic Otoscope for Quantitative Imaging of the Human Eardrum |
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Sommario/riassunto |
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Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics, Volume 2 of the Proceedings of the 2025 SEM Annual Conference & Exposition on Experimental and Applied Mechanics, the second volume of five from the Conference, brings together contributions to this important area of research and engineering. |
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