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Record Nr. |
UNINA9911022454803321 |
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Autore |
Yadav Sanjay |
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Titolo |
Advances in Metrology : Select Proceedings of AdMet 2024 / / edited by Sanjay Yadav, Naveen Garg, Mukesh Kumar, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Manoj Kumar |
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Pubbl/distr/stampa |
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Singapore : , : Springer Nature Singapore : , : Imprint : Springer, , 2025 |
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ISBN |
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Edizione |
[1st ed. 2025.] |
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Descrizione fisica |
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1 online resource (338 pages) |
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Collana |
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Lecture Notes in Mechanical Engineering, , 2195-4364 |
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Altri autori (Persone) |
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GargNaveen |
Mukesh Kumar |
AggarwalShankar G |
JaiswalShiv Kumar |
KumarManoj |
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Disciplina |
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Soggetti |
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Atoms |
Metrology |
Measurement |
Measuring instruments |
Optical measurements |
Nanotechnology |
Metrology and Fundamental Constants |
Measurement Science and Instrumentation |
Optical Metrology |
Nanometrology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Progress towards the measurement of low differential pressure by using twin-piston pressure balance in hydraulic mode -- Analysis of Source and Source Region of Coarse Mode Aerosol (PM10) in Varanasi, India -- A review on microplastics in indoor environments: Techniques for measurement and environmental implications -- Evaluating the Stratum 1 NTP Server Performance at CSIR – NPL for Nation-Wide Time Synchronization -- Data acquisition and remote monitoring of critical |
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parameters of Primary Frequency Standard. |
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Sommario/riassunto |
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This book presents the select proceedings of the 9th National Conference on Advances in Metrology (AdMet 2024). It highlights and discusses the recent technological advancements and developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, and digital metrology, gas and aerosol metrology among others. This book is aimed at those engaged in conformity assessment, quality system management, calibration, and testing in all sectors of industry as well as in academic research. The book is a valuable reference for metrologists, scientists, engineers, academicians, and students from research institutes and industrial establishments to explore future directions and research in the areas of sensors, advanced materials, measurements, and quality improvement. |
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