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Record Nr. |
UNINA9911020469003321 |
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Titolo |
Advances in speckle metrology and related techniques / / edited by Guillermo H. Kaufmann |
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Pubbl/distr/stampa |
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Weinheim, : Wiley-VCH Verlag, c2011 |
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ISBN |
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9786613140685 |
9783527633876 |
3527633871 |
9781283140683 |
1283140683 |
9783527633852 |
3527633855 |
9783527633869 |
3527633863 |
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Edizione |
[4th ed.] |
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Descrizione fisica |
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1 online resource (329 p.) |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Speckle metrology |
Optical measurements |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Advances in Speckle Metrology and Related Techniques; Contents; Preface; List of Contributors; 1 Radial Speckle Interferometry and Applications; 2 Depth-Resolved Displacement Field Measurement; 3 Single-Image Interferogram Demodulation; 4 Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods; 5 Optical Vortex Metrology; 6 Speckle Coding for Optical and Digital Data Security Applications; Index |
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Sommario/riassunto |
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Speckle metrology includes various optical techniques that are based on the speckle fields generated by reflection from a rough surface or by transmission through a rough diffuser. These techniques have proven to be very useful in testing different materials in a non-destructive way. They have changed dramatically during the last years due to the development of modern optical components, with faster and more |
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