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Record Nr. |
UNINA9911020251203321 |
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Autore |
Amerasekera E. A |
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Titolo |
ESD in silicon integrated circuits |
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Pubbl/distr/stampa |
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[Place of publication not identified], : J Wiley, 2002 |
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ISBN |
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1-280-55472-X |
9786610554720 |
0-470-85212-7 |
0-470-84605-4 |
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Edizione |
[2nd ed.] |
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Descrizione fisica |
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1 online resource (421 pages) |
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Disciplina |
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Soggetti |
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Semiconductors - Protection |
Integrated circuits - Protection |
Electrostatics |
Static eliminators |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Sommario/riassunto |
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Electrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits. |
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