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1. |
Record Nr. |
UNINA9910709819903321 |
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Autore |
Woolley Ralf R (Ralf Rumel), <1884-1948, > |
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Titolo |
The Green River and its utilization / / by Ralf R. Woolley |
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Pubbl/distr/stampa |
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[Washington, D.C.] : , : United States Department of the Interior, Geological Survey, , 1930 |
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Washington : , : United States Government Printing Office |
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Descrizione fisica |
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1 online resource (xv, 456 pages, 1 page of plates) : illustrations |
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Collana |
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Water-supply paper ; ; 618 |
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Soggetti |
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Water-power - West (U.S.) |
Water-supply - Colorado |
Water-supply - Utah |
Water-supply - Wyoming |
Water-power |
Water-supply |
Green River (Wyo.-Utah) Power utilization |
Colorado |
United States Green River (Wyoming-Utah) |
United States, West |
Utah |
Wyoming |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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2. |
Record Nr. |
UNINA9911019210903321 |
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Autore |
Brandon David |
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Titolo |
Microstructural Characterization of Materials |
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Pubbl/distr/stampa |
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ISBN |
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9786612342943 |
9781282342941 |
1282342940 |
9780470727126 |
0470727128 |
9780470727133 |
0470727136 |
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Edizione |
[2nd ed.] |
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Descrizione fisica |
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1 online resource (554 p.) |
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Collana |
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Quantitative software engineering series Microstructural characterization of materials |
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Altri autori (Persone) |
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KaplanWayne D |
BrandonD. G |
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Disciplina |
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Soggetti |
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Electronic books. -- local |
Materials -- Microscopy |
Microstructure |
Materials - Microscopy |
Materials Science |
Chemical & Materials Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di contenuto |
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Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals |
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2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane |
2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses |
3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation |
3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast |
4.3.2 Diffraction Contrast and Crystal Lattice Defects |
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Sommario/riassunto |
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Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.<br /> <br /> <i>Microstructural Characterization of Materials, 2nd Edition</i> is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental met |
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