1.

Record Nr.

UNINA9911018813403321

Autore

Jenkins Ron <1932->

Titolo

X-ray fluorescence spectrometry / / Ron Jenkins

Pubbl/distr/stampa

New York, : Wiley, c1999

ISBN

9786613905475

9781283593021

1283593025

9781118520864

1118520866

9781118521014

1118521013

9781118521045

1118521048

Edizione

[2nd ed.]

Descrizione fisica

1 online resource (230 p.)

Collana

Chemical analysis ; ; v. 152

Disciplina

543/.08586

Soggetti

X-ray spectroscopy

Fluorescence spectroscopy

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

"A Wiley-Interscience publication."

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

X-Ray Fluorescence Spectrometry; CONTENTS; PREFACE TO THE FIRST EDITION; PREFACE TO THE SECOND EDITION; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1 PRODUCTION AND PROPERTIES X-RAYS; 1.1 Introduction; 1.2 Continuous Radiation; 1.3 Characteristic Radiation; 1.4 Absorption of X-Rays; 1.5 Coherent and Incoherent Scattering; 1.6 Interference and Diffraction; Bibliography; CHAPTER 2 INDUSTRIAL APPLICATIONS OF X-RAYS; 2.1 Introduction; 2.2 Diagnostic Uses of X-Rays; 2.3 Tomography; 2.4 Level and Thickness Gauging; 2.5 X-Ray Thickness Gauging; 2.6 Nondestructive Testing

2.7 Security Screening Systems2.8 X-Ray Lithography; 2.9 X-Ray Astronomy; Bibliography; CHAPTER 3 X-RAY DIFFRACTION; 3.1 Use of X-Ray Diffraction to Study the Crystalline State; 3.2 The Powder Method; 3.3 Use of X-Ray Powder Cameras; 3.4 The Powder Diffractometer; 3.5 Qualitative Applications of the X-Ray Powder



Method; 3.6 Quantitative Methods in X-Ray Powder Diffraction; 3.7 Other Applications of X-Ray Diffraction; Bibliography; CHAPTER 4 X-RAY SPECTRA; 4.1 Introduction; 4.2 Electron Configuration of the Elements; 4.3 Fluorescent Yield; 4.4 Relationship Between Wavelength and Atomic Number

4.5 Normal Transitions (Diagram Lines)4.6 Satellite Lines; 4.7 Characteristic Line Spectra; 4.8 K Spectra; 4.9 L Spectra; 4.10 M Spectra; Bibliography; CHAPTER 5 HISTORY AND DEVELOPMENT OF X-RAY FLUORESCENCE SPECTROMETRY; 5.1 Historical Development of X-Ray Spectrometry; 5.2 Early Ideas About X-Ray Fluorescence; 5.3 Rebirth of X-Ray Fluorescence; 5.4 Evolution of Hardware Control Methods; 5.5 The Growing Role of X-Ray Fluorescence Analysis in Industry and Research; 5.6 The Arrival of Energy Dispersive Spectrometry; 5.7 Evolution of Mathematical Correction Procedures

5.8 X-Ray Analysis in the 1970s5.9 More Recent Development of X-Ray Fluorescence; Bibliography; CHAPTER 6 INSTRUMENTATION FOR X-RAY SPECTROMETRY; 6.1 Introduction; 6.2 Excitation of X-Rays; 6.3 Detection of X-Rays; 6.4 Wavelength Dispersive Spectrometers; 6.5 Energy Dispersive Spectrometers; Bibliography; CHAPTER 7 COMPARISON OF WAVELENGTH AND ENERGY DISPERSIVE SPECTROMETERS; 7.1 Introduction; 7.2 The Measurable Atomic Number Range; 7.3 The Resolution of Lines; 7.4 Measurement of Low Concentrations; 7.5 Qualitative Analysis

7.6 Geometric Constraints of Wavelength and Energy Dispersive SpectrometersBibliography; CHAPTER 8 MORE RECENT TRENDS IN X-RAY FLUORESCENCE INSTRUMENTATION; 8.1 The Role of X-Ray Fluorescence in Industry and Research; 8.2 Scope of the X-Ray Fluorescence Method; 8.3 The Determination of Low Atomic Number Elements; 8.4 Total Reflection X-Ray Fluorescence; 8.5 Synchrotron Source X-Ray Fluorescence-SSXRF; 8.6 Proton Induced X-Ray Fluorescence; Bibliography; CHAPTER 9 SPECIMEN PREPARATION AND PRESENTATION; 9.1 Form of the Sample for X-Ray Analysis; 9.2 Direct Analysis of Solid Samples

9.3 Preparation of Powder Samples

Sommario/riassunto

X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade.Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra.Ron Jenkins draws on his exte



2.

Record Nr.

UNINA9910145634603321

Titolo

12th IEEE Conference on Embedded and Real-Time Computing Systems and Applications (RTCSA 2006): 16-18 August 2006/Sydney, Australia

Pubbl/distr/stampa

[Place of publication not identified], : IEEE Computer Society Press, 2006

ISBN

9781509098026

150909802X

Descrizione fisica

1 online resource

Disciplina

004.33

Soggetti

Real-time data processing

Real-time data processing - Management

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph

Nota di contenuto

12th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications - Cover -- 12th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications - Title -- 12th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications - Copyright -- 12th IEEE International Conference on Embedded and Real-Time Computing Systems and Applications - TOC -- Foreward -- Conference organization -- Reviewers -- Rate Monotonic Schedulability Conditions Using Relative Period Ratios -- Characterization and Analysis of Tasks with Offsets: Monotonic Transactions -- Probabilistic Timing Join over Uncertain Event Streams -- A Software Infrastructure for Wearable Sensor Networks -- objSampler: A Ubiquitous Logging Tool for Recording Encounters with Real World Objects.

Sommario/riassunto

RTCSA brings together researchers and developers from academia and industry for advancing the technology of embedded and real-time computing systems and applications. The proceedings investigates advances in embedded and real-time systems and ubiquitous computing applications, promotes interaction among the areas of embedded computing, real-time computing and ubiquitous computing. RTCSA 2006 also evaluates the maturity and directions of embedded and real-time system and ubiquitous computing technology.