System-on-chip : next generation electronics / / edited by Bashir M. Al-Hashimi

• Record Nr.: UNINA9911007371003321
• Pubbl/distr/stampa: London, : Institution of Electrical Engineers, c2006
• ISBN: 1-282-15174-6; 9786612151743; 1-61583-318-8; 1-84919-020-8
• Descrizione fisica: 1 online resource (940 p.)
• Collana: IEE circuits, devices and systems series ; ; 18
• Altri autori (Persone): Al-HashimiBashir
• Disciplina: 621.381; 621.395
• Soggetti: Systems on a chip; Embedded computer systems; Microelectronics
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Contents; PART I - System-level design; 1 Multi-criteria decision making in embedded system design; 2 System-level performance analysis - the SymTA/S approach; 3 Analysis and optimisation of heterogeneous real-time embedded systems; 4 Hardware/software partitioning of operating systems: focus on deadlock avoidance; Models of computation in the design process; 6 Architecture description languages for programmable embedded systems; PART II -Embedded software; 7 Concurrent models of computation for embedded software; 8 Retargetable compilers and architecture exploration for embedded processors; 9 Software power optimisationPART III -Power reduction and management; 10 Power-efficient data management for dynamic applications; 11 Low power system scheduling, synthesis and displays; 12 Power minimisation techniques at the RT-level and below; 13 Leakage power analysis and reduction for nano-scale circuits; PART IV - Reconfigurable computing; 14 Reconfigurable computing: architectures and design methods; PART V-Architectural synthesis; 15 ; CAD tools for embedded analogue circuits in mixed-signal integrated Systems-on-Chip; 16 Clock-less circuits and system synthesis; PART VI - Network-on-chip17 Network-on-chip architectures and design methods; 18 Asynchronous on-chip networks; PART VII -Simulation and verification; 19 Covalidation of complex hardware/software systems; 20 Hardware/software cosimulation from interface perspective; 21 System-level validation using formal techniques; PART VIII - Manufacturing test; 22 Efficient modular testing and test resource partitioning for core-based SoCs; 23 On-chip test infrastructure design for optimal multi-site testing; 24 High-resolution flash time-to-digital conversion and calibration for system-on-chip testing; 25 Yield and reliability prediction forDSM circuits
• Sommario/riassunto: System-on-Chip (SoC) represents the next major market for microelectronics, and there is considerable interest world-wide in developing effective methods and tools to support the SoC paradigm. SoC is an expanding field, at present the technical and technological literature about the overall state-of-the-art in SoC is dispersed across a wide spectrum which includes books, journals, and conference proceedings.The book provides a comprehensive and accessible source of state-of-the-art information on existing and emerging SoC key research areas, provided by leading experts in th

Basic process measurements / / Cecil L. Smith

• Record Nr.: UNINA9911019330203321
• Autore: Smith Cecil L
• Pubbl/distr/stampa: Hoboken, N.J., : Wiley, c2009
• ISBN: 1-282-76459-4; 9786612764592; 0-470-92540-X; 0-470-92539-6
• Descrizione fisica: 1 online resource (358 p.)
• Disciplina: 670.42
• Soggetti: Manufacturing processes - Measurement; Engineering inspection; Measurement; Physical measurements; Measuring instruments
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Basic concepts -- Temperature -- Pressure -- Level and density -- Flow.
• Sommario/riassunto: "Basic Process Measurements provides a unique resource explaining the industrial measuring devices that gauge such key variables as temperature, pressure, density, level, and flow. With an emphasis on the most commonly installed technologies, this guide outlines both the process variable being measured as well as how the relevant measuring instruments function. The benefits of each technology are considered in turn, along with their potential problems. Looking at both new and existing technologies, the book maintains a practical focus on properly selecting and deploying the best technology for a given process application." -- Publisher's description.