1.

Record Nr.

UNINA9911006661203321

Titolo

Handbook of semiconductor silicon technology / / edited by William C. O'Mara, Robert B. Herring, Lee P. Hunt

Pubbl/distr/stampa

Park Ridge, N.J., U.S.A., : Noyes Publications, c1990

ISBN

1-282-00281-3

9786612002816

0-8155-1771-8

1-59124-294-0

Descrizione fisica

1 online resource (816 p.)

Collana

Materials science and process technology series

Altri autori (Persone)

O'MaraWilliam C

HerringRobert B

HuntLee P (Lee Philip)

Disciplina

621.381/52

Soggetti

Semiconductors

Silicon crystals

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

""Preface""; ""Contributors""; ""Contents""; ""1 Silicon Precursors: Their Manufacture and Properties""; ""2 Polysilicon Preparation""; ""3 Crystal Growth of Silicon""; ""4 Silicon Wafer Preparation""; ""5 Silicon Epitaxy""; ""6 Silicon Material Properties""; ""7 Oxygen, Carbon and Nitrogen in Silicon""; ""8 Carrier Lifetimes in Silicon""; ""9 Preparation and Properties of Polycrystalline-Silicon Films""; ""10 Silicon Phase Diagrams""; ""Index""

Sommario/riassunto

This handbook is a comprehensive summary of the science, technology and manufacturing of semiconductor silicon materials. Every known property of silicon is detailed. A complete set of binary phase diagrams is included. Practical aspects such as materials handling, safety, impurity and defect reduction are also discussed in depth. Fundamentals in the areas of silicon precursor compounds, polysilicon, silicon crystal growth, wafer fabrication, epitaxial and CVD deposition are addressed by experts in these fields. Materials properties covered include electrical, optical and mechanical properties, deep level impurities and carrier lifetime, and thermochemistry, as well as specific



sections on oxygen, carbon, and nitrogen impurities. The book contains an extensive set of references, tables of materials constants, and silicon properties, and a presentation on the state of the art of materials manufacturing.