Developments in surface contamination and cleaning . Volume four Detection, characterization, and analysis of contaminants / / edited by Rajiv Kohli and K.L. Mittal

• Record Nr.: UNINA9911004850103321
• Pubbl/distr/stampa: Amsterdam, : William Andrew, 2012
• ISBN: 1-283-29379-X; 9786613293794; 1-4377-7884-4
• Edizione: [1st ed.]
• Descrizione fisica: 1 online resource (361 p.)
• Altri autori (Persone): KohliRajiv; MittalK. L
• Disciplina: 620.44
• Soggetti: Surfaces (Technology) - Inspection; Surface contamination - Prevention; Cleaning; Coatings; Dust control
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Front Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Basics and Sampling of Particles for Size Analysis and Identification; 1.Introduction and basics; 2.Sampling; 3.Solvents and solubility parameters; 4.Cleanroom airflows and their consideration in contamination sampling; 5.Summary; References; Chapter 2 - Computational Fluid Dynamics of Particle Transport and Deposition; 1 Introduction; 2 Formulation; 3 Applications; 4 Conclusions; Acknowledgments; References; Chapter 3 - Methods for Monitoring and Measuring Cleanliness of Surfaces1 Introduction; 2 Types of Contaminants; 3 Product Cleanliness Levels; 4 Methods for Monitoring Surface Cleanliness; 5 Summary; Disclaimer; Acknowledgment; References; Chapter 4 - Size Analysis and Identification of Particles; 1 Introduction; 2 Particle Identification; 3 Summary; References; Chapter 5 - Developments in Imaging and ; Analysis Techniques for Micro- and Nanosize Particles and Surface Features; 1 Introduction; 2 Impact of Contaminants; 3 Nature and Size of Particles; 4 Recent Developments in Characterization Techniques5 Miscellaneous Innovative Applications of Characterization Methods; 6 Summary; Disclaimer; References; Chapter 6 - Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions; 1 Introduction; 2 AFM - Modes of Operation; 3 Adhesion Forces; 4 Application of AFM; 5 Summary; References; Index
• Sommario/riassunto: In this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contamination. The expert contributions in this volume cover important fundamental aspects of surface contamination that are key to understanding the behavior of specific types of contaminants. This understanding is essential to develop preventative and mitigation methods for contamination cont