1.

Record Nr.

UNINA9911004827403321

Titolo

Conveyance of residuals from water and wastewater treatment / / Sludge Treatment, Utilization, Reclamation, and Disposal Committee of the Environmental and Water Resources Institute of the American Society of Civil Engineers

Pubbl/distr/stampa

Reston, Va., : American Society of Civil Engineers, c2000

ISBN

0-7844-7050-2

Descrizione fisica

1 online resource (193 p.)

Collana

ASCE manuals and reports on engineering practice ; ; no. 98

Disciplina

628.3/64

Soggetti

Sewage sludge - Management

Sewage sludge - Characterization

Sewage disposal plants - Design and construction

Water treatment plant residuals - Management

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Introduction; Rheology and the Distribution of Water in Sludge; Sludge Sources, Composition, and Characteristics; Overview of Residuals Conveyance Devices; Pumping of Non-Newtonian Sludges and Slurries; Transport of Thickened Residuals; Conveyance of Dewatered Residuals; Transport of Granular and Compactable Residuals; Case Histories; Index

Sommario/riassunto

Prepared by the Environmental and Water Resources Institute of ASCE.  This Manual of Practice provides detailed guidance to determine the handling characteristics of residuals and to select appropriate conveyance systems. As residuals are processed and handled, their intrinsic properties (such as viscosity, rheology, flowability, and texture) change. If these changes are not recognized and the proper transport devices used, problems can result in the processing and disposal of these materials. To ensure correct handling and transport of residuals, this manual describes a procedure for classifying residuals according to their transport properties. A detailed examination of the rheology, composition, and transport characteristics of residual solids is included, as well as a comprehensive listing of the equipment



available, with photographs and illustrations, for transporting residuals. By providing details on handling characteristics and transport equipment, this manual assists engineers in determining the most efficient type of transport for each of the major classifications of residuals: non-Newtonian slurries, thickened residuals, dewatered residuals, and granular and compactable residuals. Four case studies, highlighting lessons from actual operating installations, are also included. The specific equipment that produces the residuals to be conveyed is discussed to define any operating factors that could affect the transport characteristics.

2.

Record Nr.

UNINA9910961790903321

Autore

Galup-Montoro Carlos

Titolo

MOSFET modeling for circuit analysis and design / / Carlos Galup-Montoro, Marcio Cherem Schneider

Pubbl/distr/stampa

Singapore ; ; Hackensack, NJ, : World Scientific, c2007

ISBN

9786611120870

9781281120878

1281120871

9789812707598

981270759X

Edizione

[1st ed.]

Descrizione fisica

1 online resource (445 p.)

Collana

International series on advances in solid state electronics and technology

Altri autori (Persone)

SchneiderMárcio Cherem

Disciplina

621.3815284

Soggetti

Metal oxide semiconductor field-effect transistors - Mathematical models

Field-effect transistors - Mathematical models

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di bibliografia

Includes bibliographical references and index.

Nota di contenuto

Foreword; Preface; Contents; List of Selected Symbols; Chapter 1 Introduction; Chapter 2 The MOS Capacitor; Chapter 3 The Long-Channel MOSFET: Theory and dc Equations; Chapter 4 The Real MOS Transistor: dc Models; Chapter 5 Stored Charges and Capacitive Coefficients; Chapter 6 Mismatch Modeling; Chapter 7 Noise in



MOSFETs; Chapter 8 High-Frequency Models; Chapter 9 Gate and Bulk Currents; Chapter 10 Advanced MOSFET Structures; Chapter 11 MOSFET Parameter Extraction; Chapter 12 Advanced MOSFET Models for Circuit Simulators; Appendix A Electrostatics in One Dimension

Appendix B Electrostatics in SemiconductorsAppendix C Drift-diffusion Current Model; Appendix D Continuity Equations; Appendix E Basics of pn Junctions; Appendix F Hall-Shockley-Read (HSR) Statistics; Appendix G Interface Trap Capacitance; Index

Sommario/riassunto

This is the first book dedicated to the next generation of MOSFET models. Addressed to circuit designers with an in-depth treatment that appeals to device specialists, the book presents a fresh view of compact modeling, having completely abandoned the regional modeling approach. Both an overview of the basic physics theory required to build compact MOSFET models and a unified treatment of inversion-charge and surface-potential models are provided. The needs of digital, analog and RF designers as regards the availability of simple equations for circuit designs are taken into account. Compact ex