1.

Record Nr.

UNINA9910954049303321

Autore

Hazners Dainis <1957->

Titolo

(Some of) the adventures of Carlyle, my imaginary friend / / by Dainis Hazners

Pubbl/distr/stampa

Iowa City, : University of Iowa Press, c2004

ISBN

9781587294815

1587294818

Edizione

[1st ed.]

Descrizione fisica

1 online resource (125 p.)

Collana

Iowa poetry prize

Disciplina

811/.6

Soggetti

American poetry - 21st century

American literature

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.

Nota di contenuto

Table of Contents; Poetry begins

Sommario/riassunto

At first glance these poems (which read like one long odyssey) seem  sweet and peaceful-like taking a walk in the woods. But then, things  turn darker: a storm blows in-and with it some Aliens, Ghost and Ghoul,  the Hanging Man. Luckily, Carlyle has a few good friends such as Ruth,  the Hag, the Boy, who are staunch and true and faithful. A  whistling-in-the-dark suspense alternately stimulates and enervates the  witness."Carlyle is spore, and mild. / He is swoon &sherbet."  Endearing and kind, if not actually cruel, he is also cold and strange.  He shapeshifts, transforming



2.

Record Nr.

UNINA9910360854203321

Titolo

Nanoelectronic Coupled Problems Solutions / / edited by E. Jan W. ter Maten, Hans-Georg Brachtendorf, Roland Pulch, Wim Schoenmaker, Herbert De Gersem

Pubbl/distr/stampa

Cham : , : Springer International Publishing : , : Imprint : Springer, , 2019

ISBN

3-030-30726-3

Edizione

[1st ed. 2019.]

Descrizione fisica

1 online resource (XXX, 587 p. 300 illus., 200 illus. in color.)

Collana

The European Consortium for Mathematics in Industry, , 2946-1871 ; ; 29

Disciplina

003.3

Soggetti

Mathematical models

Mathematical optimization

Mathematical Modeling and Industrial Mathematics

Continuous Optimization

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di contenuto

Equations, discretizations -- Time integration for coupled problems -- Uncertainty quantification -- Model order reduction -- Robustness, reliability, ageing -- Testcases and measurements.

Sommario/riassunto

Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to



predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms’ industrial applicability.