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Record Nr. |
UNINA9910877115103321 |
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Titolo |
Surface and thin film analysis : a compendium of principles, instrumentation, and applicaitons / / edited by Gernot Friedbacher and Henning Bubert |
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Pubbl/distr/stampa |
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Weinheim, Germany, : Wiley-VCH, 2011 |
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ISBN |
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1-283-14094-2 |
9786613140944 |
3-527-63694-3 |
3-527-63692-7 |
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Edizione |
[2nd, completely rev. and enl. ed.] |
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Descrizione fisica |
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1 online resource (559 p.) |
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Altri autori (Persone) |
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FriedbacherGernot |
BubertH (Henning) |
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Disciplina |
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Soggetti |
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Thin films - Surfaces - Analysis |
Electron spectroscopy |
Spectrum analysis |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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pt. 1. Electron detection -- pt. 2. Ion detection -- pt. 3. Photon detection -- pt. 4. Scanning probe microscopy. |
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Sommario/riassunto |
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Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid ref |
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