Materials characterization : introduction to microscopic and spectroscopic methods / / Yang Leng

• Record Nr.: UNINA9910876874103321
• Autore: Leng Y (Yang)
• Pubbl/distr/stampa: Singapore ; ; Hoboken, NJ, : J. Wiley, c2008
• ISBN: 9786612031403; 0-470-82299-6; 0-470-82300-3
• Descrizione fisica: 1 online resource (351 p.)
• Disciplina: 620.1/1; 620.11; 620.1127
• Soggetti: Materials; Materials - Analysis
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: MATERIALS CHARACTERIZATION Introduction to Microscopic and Spectroscopic Methods; Contents; Preface; 1 Light Microscopy; 1.1 Optical Principles; 1.1.1 Image Formation; 1.1.2 Resolution; 1.1.3 Depth of Field; 1.1.4 Aberrations; 1.2 Instrumentation; 1.2.1 Illumination System; 1.2.2 Objective Lens and Eyepiece; 1.3 Specimen Preparation; 1.3.1 Sectioning; 1.3.2 Mounting; 1.3.3 Grinding and Polishing; 1.3.4 Etching; 1.4 Imaging Modes; 1.4.1 Bright-Field and Dark-Field Imaging; 1.4.2 Phase Contrast Microscopy; 1.4.3 Polarized Light Microscopy; 1.4.4 Nomarski Microscopy; 1.4.5 Fluorescence Microscopy1.5 Confocal Microscopy; 1.5.1 Working Principles; 1.5.2 Three-Dimensional Images; References; Questions; 2 X-ray Diffraction Methods; 2.1 X-ray Radiation; 2.1.1 Generation of X-rays; 2.1.2 X-ray Absorption; 2.2 Theoretical Background of Diffraction; 2.2.1 Diffraction Geometry; 2.2.2 Diffraction Intensity; 2.3 X-ray Diffractometry; 2.3.1 Instrumentation; 2.3.2 Samples and Data Acquisition; 2.3.3 Distortions of Diffraction Spectra; 2.3.4 Applications; 2.4 Wide Angle X-ray Diffraction and Scattering; 2.4.1 Wide Angle Diffraction; 2.4.2 Wide Angle Scattering; ReferencesQuestions; 3 Transmission Electron Microscopy; 3.1 Instrumentation; 3.1.1 Electron Sources; 3.1.2 Electromagnetic Lenses; 3.1.3 Specimen Stage; 3.2 Specimen Preparation; 3.2.1 Pre-Thinning; 3.2.2 Final Thinning; 3.3 Image Modes; 3.3.1 Mass-Density Contrast; 3.3.2 Diffraction Contrast; 3.3.3 Phase Contrast; 3.4 Selected Area Diffraction; 3.4.1 Selected Area Diffraction Characteristics; 3.4.2 Single-Crystal Diffraction; 3.4.3 Multi-Crystal Diffraction; 3.4.4 Kikuchi Lines; 3.5 Images of Crystal Defects; 3.5.1 Wedge Fringe; 3.5.2 Bending Contours; 3.5.3 Dislocations; References; Questions4 Scanning Electron Microscopy; 4.1 Instrumentation; 4.1.1 Optical Arrangement; 4.1.2 Signal Detection; 4.1.3 Probe Size and Current; 4.2 Contrast Formation; 4.2.1 ElectronSpecimen Interactions; 4.2.2 Topographic Contrast; 4.2.3 Compositional Contrast; 4.3 Operational Variables; 4.3.1 Working Distance and Aperture Size; 4.3.2 Acceleration Voltage and Probe Current; 4.3.3 Astigmatism; 4.4 Specimen Preparation; 4.4.1 Preparation for Topographic Examination; 4.4.2 Preparation for Micro-Composition Examination; 4.4.3 Dehydration; References; Questions; 5 Scanning Probe Microscopy; 5.1 Instrumentation5.1.1 Probe and Scanner; 5.1.2 Control and Vibration Isolation; 5.2 Scanning Tunneling Microscopy; 5.2.1 Tunneling Current; 5.2.2 Probe Tips and Working Environments; 5.2.3 Operational Modes; 5.2.4 Typical Applications; 5.3 Atomic Force Microscopy; 5.3.1 Near-Field Forces; 5.3.2 Force Sensors; 5.3.3 Operational Modes; 5.3.4 Typical Applications; 5.4 Image Artifacts; 5.4.1 Tip; 5.4.2 Scanner; 5.4.3 Vibration and Operation; References; Questions; 6 X-ray Spectroscopy for Elemental Analysis; 6.1 Features of Characteristic X-rays; 6.1.1 Types of Characteristic X-rays; 6.1.2 Comparison ofK,L andM Series
• Sommario/riassunto: This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fl