Record Nr.

UNINA9910873062103321

Titolo

ICMTS 2004 : proceedings of the 2004 International Conference on Microelectronic Test Structures : March 22-25, 2004, Awaji Yumebutai International Conference Center, Japan

Pubbl/distr/stampa


[Place of publication not identified], : IEEE, 2004

Soggetti

Integrated circuits - Testing

Semiconductors - Testing

Electronic apparatus and appliances - Testing

Electrical & Computer Engineering

Engineering & Applied Sciences

Electrical Engineering

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph