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Record Nr. |
UNINA9910872957903321 |
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Titolo |
2000 5th International Symposium on Plasma Process-Induced Damage : May 22-24, 2000, Santa Clara, California, USA |
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Pubbl/distr/stampa |
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[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 2000 |
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Disciplina |
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Soggetti |
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Semiconductor wafers - Effect of radiation on |
Semiconductors |
Plasma radiation |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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