1.

Record Nr.

UNINA9910872954903321

Titolo

1997 2nd International Symposium on Plasma Process-Induced Damage : 13-14 May 1997, Monterey, California, USA

Pubbl/distr/stampa

[Place of publication not identified], : Northern California Chapter of the American Vacuum Society, 1997

Disciplina

621.3815/2

Soggetti

Semiconductor wafers - Defects

Semiconductors - Effect of radiation on

Plasma etching - Congresses

Electrical & Computer Engineering

Electrical Engineering

Engineering & Applied Sciences

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph