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Record Nr. |
UNINA9910872647503321 |
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Titolo |
1998 IEEE International Reliability Physics Symposium |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 1998 |
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Descrizione fisica |
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1 online resource (400 pages) |
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Disciplina |
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Soggetti |
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Electronic apparatus and appliances - Reliability |
Integrated circuits - Reliability |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Sommario/riassunto |
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The IRPS deals with physical mechanisms that reduce the reliability or performance of integrated circuits and microelectronics derived in the user's environment. This conference covers the identification of new microelectronic failure or degradation mechanisms. |
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