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1. |
Record Nr. |
UNINA9910872615003321 |
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Titolo |
1999 4th International Workshop on Statistical Metrology |
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Pubbl/distr/stampa |
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[Place of publication not identified], : Purchased from IEEE Service Center Single Publication Sales Unit, 1999 |
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Disciplina |
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Soggetti |
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Semiconductors - Characterization - Statistical methods |
Semiconductors - Measurement |
Electrical Engineering |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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2. |
Record Nr. |
UNISANNIOMIL0036060 |
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Titolo |
Proceedings of the IEEE / published monthly by the Institute of electrical and electronics engineers |
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Pubbl/distr/stampa |
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New York, : Institute of Electrical and Electronics Engineers, 1963- |
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ISSN |
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Descrizione fisica |
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Disciplina |
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Soggetti |
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Collocazione |
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PER. ING. PROOTI01PER. ING. PROOTI01PER. ING. PROOTI |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Periodico |
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Note generali |
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