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Record Nr. |
UNINA9910872558103321 |
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Titolo |
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : proceedings : 3-5 November, 2003, Boston, Massachusetts |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE Computer Society Press, 2003 |
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Soggetti |
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Integrated circuits - Design and construction - Very large scale integration |
Fault-tolerant computing |
Electrical & Computer Engineering |
Electrical Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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