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Record Nr. |
UNINA9910872527003321 |
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Titolo |
DBT 2004 : 2004 IEEE International Workshop on Current & Defect Based Testing : proceedings : April 25, 2004, Napa Valley Marriott, Napa Valley, CA, USA |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2004 |
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Disciplina |
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Soggetti |
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Metal oxide semiconductors, Complementary - Defects |
Integrated circuits |
Iddq testing |
Electrical & Computer Engineering |
Electrical Engineering |
Engineering & Applied Sciences |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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