|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910841487703321 |
|
|
Titolo |
Characterization and modeling to control sintered ceramic microstructures amd properties [[electronic resource] ] : proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004) / / editor, C.B. DiAntonio |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
Westerville, Ohio, : American Ceramic Society, c2005 |
|
|
|
|
|
|
|
ISBN |
|
1-280-67444-X |
9786613651372 |
1-118-40708-3 |
1-118-40712-1 |
|
|
|
|
|
|
|
|
Descrizione fisica |
|
1 online resource (138 p.) |
|
|
|
|
|
|
Collana |
|
Ceramic transactions ; ; v. 157 |
|
|
|
|
|
|
Altri autori (Persone) |
|
DiAntonioC. B (Christopher B.) |
|
|
|
|
|
|
Soggetti |
|
Ceramics |
Ceramic materials |
Sintering |
Ceramics - Microstructure |
|
|
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Note generali |
|
"... papers originally presented at the Characterization and Modeling to Control Sintered Ceramic Microstructure and Properties Symposium held during the 106h Annual Meeting of the American Society in Indianapolis, Indiana, April 18-21, 2004"--p. vii. |
|
|
|
|
|
|
|
|
Nota di bibliografia |
|
Includes bibliographical references and indexes. |
|
|
|
|
|
|
Nota di contenuto |
|
Characterization and Modeling to Control Sintered Ceramic Microstructures and Properties; Contents; Preface; Characterizing Sintering; Utilizing the Master Sintering Curve to Probe Sintering Mechanisms; Controlled and Predicted Ceramic Sintering Through Master Sintering Curve Theory; Sintering Damage During Multi-Material Sintering; Modeling Sintering; Sintering of Oriented Pore Grain Structures; Finite Element Simulation of Densification and Shape Deformation During Sintering; Application of a Microstructure-Based Model for Sintering and Creep; Microstructure and Properties |
Processing and Microstructure Characterization of Transparent Spinel MonolithsParticle Bonding Technology for Composite Materials-Microstructure Control and its Characterization; Evaluation of |
|
|
|
|