Neutrons and synchrotron radiation in engineering materials science [[electronic resource] ] : from fundamentals to superior materials characterization / / edited by Walter Reimers ... [et al.]

• Record Nr.: UNINA9910830594403321
• Pubbl/distr/stampa: Weinheim, : Wiley-VCH, 2007
• ISBN: 1-282-37221-1; 9786612372216; 3-527-62193-8; 3-527-62192-X
• Descrizione fisica: 1 online resource (462 p.)
• Altri autori (Persone): ReimersW <1943-> (Walter)
• Disciplina: 620.11272
• Soggetti: Synchrotron radiation; Materials - Testing; Materials - Analysis; Materials - Effect of radiation on
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Neutrons and Synchrotron Radiation in Engineering Materials Science; Contents; Preface; List of Contributors; Part I General; 1 Microstructure and Properties of Engineering Materials; 2 Internal Stresses in Engineering Materials; 3 Texture and Texture Analysis in Engineering Materials; 4 Physical Properties of Photons and Neutrons; 5 Radiation Sources; Part II Methods; 6 Introduction to Diffraction Methods for Internal Stress Analyses; 7 Stress Analysis by Angle-Dispersive Neutron Diffraction; 8 Stress Analysis by Energy-Dispersive Neutron Diffraction; 9 Residual Stress Analysis by Monochromatic High-Energy X-rays10 Residual Stress Analysis by White High Energy X-Rays; 11 Diffraction Imaging for Microstructure Analysis; 12 Basics of Small-Angle Scattering Methods; 13 Small-Angle Neutron Scattering; 14 Decomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray Scattering; 15 B3 Imaging; 16 Neutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomography; 17 μ-Tomography of ; Engineering Materials; 18 Diffraction Enhanced Imaging; Part III New and Emerging Methods19 3D X-ray Diffraction Microscope; 20 3D Micron-Resolution Laue Diffraction; 21 Quantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption Tomography; 22 Combined Diffraction and Tomography; Part IV Industrial Applications; 23 Diffraction-Based Residual Stress Analysis Applied to Problems in the Aircraft Industry; 24 Optimization of Residual Stresses in Crankshafts; Index
• Sommario/riassunto: Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.