1.

Record Nr.

UNISA996394155603316

Autore

Fuller Thomas <1608-1661.>

Titolo

The church-history of Britain [[electronic resource] ] : from the birth of Jesus Christ untill the year M.DC.XLVIII / / endeavoured by Thomas Fuller

Pubbl/distr/stampa

London, : Printed for Iohn Williams ..., 1656

Descrizione fisica

11 pts. in 4 ([9], 171, [1]; [8], 427, [1] p., 5 leaves of plates; [8], 235, [1]; [8], 114, [6], 117-238 p.) : port

Soggetti

Abbeys - Great Britain - History

Great Britain Church history 17th century

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Each part has either half title or special t.p. with separate paging.

Manuscript notes inserted between p. 74-75 in third paging sequence.

Reproduction of original in Bodleian Library.

Sommario/riassunto

eebo-0014



2.

Record Nr.

UNINA9910710014203321

Autore

Christ Bruce W

Titolo

Metallurgical evaluation and fracture analysis of a pneumatically-burst seamless steel compressed gas cylinder / / Bruce W. Christ; John H. Smith

Pubbl/distr/stampa

Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1977

Descrizione fisica

1 online resource

Collana

NBSIR ; ; 76-1181

Altri autori (Persone)

ChristBruce W

SmithJohn H

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

1977.

Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.

Title from PDF title page.

Nota di bibliografia

Includes bibliographical references.



3.

Record Nr.

UNINA9910830357303321

Titolo

Electrochemical nanotechnology [[electronic resource] ] : in-situ local probe techniques at electrochemical interfaces / / edited by W.J. Lorenz and W. Plieth

Pubbl/distr/stampa

Weinheim ; ; Chichester, : Wiley-VCH, c1998

ISBN

1-281-76387-X

9786611763879

3-527-61215-7

3-527-61214-9

Edizione

[1st ed.]

Descrizione fisica

1 online resource (354 p.)

Altri autori (Persone)

LorenzW. J

PliethW (Waldfried)

Disciplina

620.5

Soggetti

Nanotechnology

Atomic force microscopy

Electrochemistry

Scanning probe microscopy

Scanning tunneling microscopy

Surface chemistry

Surfaces (Physics)

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Includes index.

"A publication initiated by IUPAC."

Nota di contenuto

Electrochemical Nanotechnology; Preface; Contents; Part I General Aspects; Local Probing of Electrochemical Processes at Non-ideal Electrodes; Electrochemistry and Nanotechnology; Imaging of Electrochemical Processes and Biological Macromolecular Adsorbates by in-situ Scanning Tunneling Microscopy; Beyond the Landscapes: Imaging the Invisible; Part II Roughness and Interface Structure; Roughness Kinetics and Mechanism Derived from the Analysis of AFM and STM Imaging Data; Electrodes with a Defined Mesoscopic Structure

In-situ Stress Measurements at the Solid/liquid Interface Using a Micromechanical SensorSurface Structure and Electrochemistry: New



Insight by Scanning Tunneling Microscopy; Part III Surface Modification; STM and AFM Studies of the Electrified Solid-Liquid Interface: Monolayers, Multilayers, and Organic Transformations; Scanning Probe Microscopy Studies of Molecular Redox Films; New Aspects of Iodine-modified Single-crystal Electrodes; The Growth and the Surface Properties of Polypyrrole on Single Crystal Graphite Electrodes as Studied by in-situ Electrochemical Scanning Probe Microscopy

Part IV Nucleation and ElectrodepositionNucleation and Growth at Metal Electrode Surfaces; STM Studies of Electrodeposition of Strained-Layer Metallic Superlattices; Part V Oxide Layers and Corrosion; STM Studies of Thin Anodic Oxide Layer; Local Probing of Electrochemical Interfaces in Corrosion Research; Morphology and Nucleation of Ni-Ti02 LIGA Layers; SPM Investigations on Oxide-covered Titanium Surfaces: Problems and Possibilities; Part VI Semiconductors; Electrochemical Surface Processing of Semiconductors at the Atomic Level

In-situ Electrochemical AFM Study of Semiconductor Electrodes in Electrolyte SolutionsPart VII STM and Complementary Methods; In-situ STM and Electrochemical UHV Technique: Complementary, Noncompeting Techniques; Growth Morphology and Molecular Orientation of Additives in Electrocrystallization Studied by Surface-enhanced Raman spectroscopy; Instrumental Design and Prospects for NMR-Electrochemistry; List of Contributors; List of Abbreviations; Symbol List; Subject Index

Sommario/riassunto

A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local probe methods in different systems belongs to modern nanotechnology and has two aspects: an analytical aspect and a preparative aspect. The first aspect covers the application of the local probe methods to characterize thermodynamic, structural and dynamic properties of solid state surfaces a