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Record Nr. |
UNINA9910828666603321 |
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Autore |
Milosevic Milan <1955-> |
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Titolo |
Internal reflection and ATR spectroscopy / / Milan Milosevic |
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Pubbl/distr/stampa |
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Hoboken, N.J., : John Wiley & Sons, c2012 |
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ISBN |
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9786613620934 |
9781280591105 |
1280591102 |
9781118309766 |
1118309766 |
9781118309742 |
111830974X |
9781118309711 |
1118309715 |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (263 p.) |
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Collana |
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Chemical analysis : a series of monographs on analytical chemistry and its applications ; ; v. 176 |
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Disciplina |
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Soggetti |
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Internal reflection spectroscopy |
Absorption spectra |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Nota di contenuto |
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INTERNAL REFLECTION AND ATR SPECTROSCOPY; CONTENTS; PREFACE; 1: Introduction to Spectroscopy; 1.1 HISTORY; 1.2 DEFINITION OF TRANSMITTANCE AND REFLECTANCE; 1.3 THE SPECTROSCOPIC EXPERIMENT AND THE SPECTROMETER; 1.4 PROPAGATION OF LIGHT THROUGH A MEDIUM; 1.5 TRANSMITTANCE AND ABSORBANCE; 1.6 S/N IN A SPECTROSCOPIC MEASUREMENT; 2: Harmonic Oscillator Model for Optical Constants; 2.1 HARMONIC OSCILLATOR MODEL FOR POLARIZABILITY; 2.2 CLAUSIUS-MOSSOTTI EQUATION; 2.3 REFRACTIVE INDEX; 2.4 ABSORPTION INDEX AND CONCENTRATION; 3: Propagation of Electromagnetic Energy |
3.1 POYNTING VECTOR AND FLOW OF ELECTROMAGNETIC ENERGY3.2 LINEAR MOMENTUM OF LIGHT; 3.3 LIGHT ABSORPTION IN ABSORBING MEDIA; 3.4 LAMBERT LAW AND MOLECULAR CROSS SECTION; 4: Fresnel Equations; 4.1 ELECTROMAGNETIC FIELDS AT THE INTERFACE; 4.2 |
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SNELL'S LAW; 4.3 BOUNDARY CONDITIONS AT THE INTERFACE; 4.4 FRESNEL FORMULAE; 4.5 REFLECTANCE AND TRANSMITANCE OF INTERFACE; 4.6 SNELL'S PAIRS; 4.7 NORMAL INCIDENCE; 4.8 BREWSTER'S ANGLE; 4.9 THE CASE OF THE 45° ANGLE OF INCIDENCE; 4.10 TOTAL INTERNAL REFLECTION; 5: Evanescent Wave; 5.1 EXPONENTIAL DECAY AND PENETRATION DEPTH |
5.2 ENERGY FLOW AT A TOTALLY INTERNALLY REFLECTING INTERFACE 5.3 THE EVANESCENT WAVE IN ABSORBING MATERIALS; 6: Electric Fields at a Totally Internally Reflecting Interface; 6.1 EX, EY, AND EZ FOR S-POLARIZED INCIDENT LIGHT; 6.2 EX, EY, AND EZ FOR P-POLARIZED INCIDENT LIGHT; 7: Anatomy of ATR Absorption; 7.1 ATTENUATED TOTAL REFLECTION (ATR) REFLECTANCE FOR S- AND P-POLARIZED BEAM; 7.2 ABSORBANCE TRANSFORM OF ATR SPECTRA; 7.3 WEAK ABSORPTION APPROXIMATION; 7.4 SUPERCRITICAL REFLECTANCE AND ABSORPTION OF EVANESCENT WAVE; 7.5 THE LEAKY INTERFACE MODEL; 8: Effective Thickness |
8.1 DEFINITION AND EXPRESSIONS FOR EFFECTIVE THICKNESS 8.2 EFFECTIVE THICKNESS AND PENETRATION DEPTH; 8.3 EFFECTIVE THICKNESS AND ATR SPECTROSCOPY; 8.4 EFFECTIVE THICKNESS FOR STRONG ABSORPTIONS; 9: Internal Reflectance near Critical Angle; 9.1 TRANSITION FROM SUBCRITICAL TO SUPERCRITICAL REFLECTION; 9.2 EFFECTIVE THICKNESS AND REFRACTIVE INDEX OF SAMPLE; 9.3 CRITICAL ANGLE AND REFRACTIVE INDEX OF SAMPLE; 10: Depth Profiling; 10.1 ENERGY ABSORPTION AT DIFFERENT DEPTHS; 10.2 THIN ABSORBING LAYER ON A NONABSORBING SUBSTRATE; 10.3 THIN NONABSORBING FILM ON AN ABSORBING SUBSTRATE |
10.4 THIN NONABSORBING FILM ON A THIN ABSORBING FILM ON A NONABSORBING SUBSTRATE11: Multiple Interfaces; 11.1 REFLECTANCE AND TRANSMITTANCE OF A TWO-INTERFACE SYSTEM; 11.2 VERY THIN FILMS; 11.3 INTERFERENCE FRINGES; 11.4 NORMAL INCIDENCE; 11.5 INTERFERENCE FRINGES AND TRANSMISSION SPECTROSCOPY; 11.6 THIN FILMS AND ATR; 11.7 INTERNAL REFLECTION: SUBCRITICAL, SUPERCRITICAL, AND IN BETWEEN; 11.8 UNUSUAL FRINGES; 11.9 PENETRATION DEPTH REVISITED; 11.10 REFLECTANCE AND TRANSMITTANCE OF A MULTIPLE INTERFACE SYSTEM; 12: Metal Optics; 12.1 ELECTROMAGNETIC FIELDS IN METALS; 12.2 PLASMA |
12.3 REFLECTANCE OF METAL SURFACES |
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Sommario/riassunto |
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Attenuated Total Reflection (ATR) Spectroscopy is now the most frequently used sampling technique for infrared spectroscopy. This book fully explains the theory and practice of this method.Offers introduction and history of ATR before discussing theoretical aspectsIncludes informative illustrations and theoretical calculationsDiscusses many advanced aspects of ATR, such as depth profiling or orientation studies, and particular features of reflectance |
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