Dielectric materials : introduction, research and applications / / Ram Naresh Prasad Choudhary, Sunanda Kumari Patri

• Record Nr.: UNINA9910827239303321
• Autore: Choudhary Ram Naresh Prasad
• Pubbl/distr/stampa: New York., : Nova Science Publishers, 2009
• ISBN: 1-61728-367-3
• Edizione: [1st ed.]
• Descrizione fisica: 1 online resource (166 p.)
• Collana: Materials science and technologies
• Altri autori (Persone): PatriSunanda Kumari
• Disciplina: 537/.24
• Soggetti: Dielectrics
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Intro -- Library of Congress Cataloging-in-Publication Data -- Contents -- Preface -- Acknowledgement -- Chapter 1 -- Introduction -- Chapter 2 -- Classification of Dielectrics -- (A) Non-Ferroelectric Materials -- (B) Ferroelectric Materials -- Chapter 3 -- History -- 3.1. Ferroelectricity -- 3.2. Pyroelectricity -- 3.3. Piezoelectricity -- 3.4. Multiferroicity -- Chapter 4 -- Dielectric Response of Materials -- Chapter 5 -- Dielectric Spectroscopy -- 5.1. Phase Transition -- 5.2. Diffuse Phase Transition -- 5.3. Dielectric Relaxation -- Chapter 6 -- Synthesis of Different Dielectric Materials -- 6.1. Single Crystal -- 6.2. Ceramics -- 1) Mechanical Methods -- 2) Chemical Methods -- 6.3. Thin Film -- 6.4. Polymers -- 6.4.1. Electrical Properties of Polymers -- 6.4.2. Different Types of Dielectric Polymers -- 6.5. Liquid Crystals -- Thermotropic LCs -- Lyotropic -- Metallotropic -- 6.5.1. Ferroelectric Liquid Crystals -- 6.5.2. Dielectric Spectroscopy of Liquid Crystal -- Chapter 7 -- Characterization Techniques -- 7.1. Thermal Analysis -- 7.1.1. Differential Thermal Analysis (DTA) -- 7.1.2. Thermo Gravimetric Analysis (TGA) -- 7.3. Structural and Microstructural Analysis -- 7.3.1. X-ray Diffraction Study (XRD) -- 7.3.2. Scanning Electron Microscopy (SEM) -- 7.3.3. Transmission Electron Microscopy (TEM) -- 7.3.4. FTIR Spectroscopy -- 7.3.5. Raman Spectroscopy -- 7.4. Dielectric Study -- 7.4.1. Spontaneous Polarization Study -- 7.4.2. Pyroelectric Studies -- 7.4.3. Piezoelectric Study -- 7.5. Electrical Property -- 7.5.1. Complex Impedance Spectroscopy -- 7.5.2. Electrical Conductivity Study -- ac Conductivity -- dc Conductivity -- Chapter 8 -- Research on some ; Dielectric Materials -- 8.1. Hydrogen-Bonded Materials -- 8.1.1. KH2PO4 -- 8.1.2. PbHPO4 -- 8.1.3. CsH2PO4 -- 8.2. Oxide Ferroelectrics -- 8.2.1. Perovskite Structures.; (a) Charge Neutrality -- (b) Goldschmidt Tolerance Factor -- 8.2.2. Tungsten Bronze Structure -- 8.2.3. Layered Structure Oxides and Complex Compounds -- 8.2.4. Pyrochlore Oxides -- 8.2.4. Other Dielectrics -- Chapter 9 -- Complex Impedance Spectroscopy of Dielectric Materials -- Chapter 10 -- Multiferroic Property of Dielectric Materials -- Chapter 11 -- Applications -- 11.1. Dielectric Devices -- 11.2. Piezoelectric Devices -- 11.3. Pyroelectric Devices -- 11.4. Ferroelectric Devices -- 11.5. Multiferroic Devices -- 11.6. Other Applications -- Chapter 12 -- Conclusion -- References -- Index -- Blank Page.