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Record Nr. |
UNINA9910824874103321 |
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Titolo |
Mechanical stress on the nanoscale : simulation, material systems and characterization techniques / / edited by Margrit Hanbücken, Pierre Müller, and Ralf B. Wehrspohn |
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Pubbl/distr/stampa |
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Weinheim, Germany, : Wiley-VCH, 2011 |
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ISBN |
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3-527-63955-1 |
1-283-37949-X |
9786613379498 |
3-527-63954-3 |
3-527-63956-X |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (382 p.) |
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Altri autori (Persone) |
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HanbückenMargrit |
MüllerPierre |
WehrspohnRalf B |
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Disciplina |
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Soggetti |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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pt. 1. Fundamentals of stress and strain on the nanoscale -- pt. 2. Model systems with stress-engineered properties -- pt. 3. Characterization techniques of measuring stresses on the nanoscale. |
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Sommario/riassunto |
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Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques. Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics. |
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