1.

Record Nr.

UNINA9910818213003321

Titolo

Safety and security of commercial spent nuclear fuel storage : public report / / Committee on the Safety and Security of Commercial Spent Nuclear Fuel Storage, National Research Council

Pubbl/distr/stampa

Washington, District of Columbia : , : National Academies Press, , 2006

©2006

ISBN

0-309-10511-0

Descrizione fisica

1 online resource (127 p.)

Disciplina

363.72/89

Soggetti

Spent reactor fuels - Storage

Plutonium - Recycling

Radioactive waste disposal - United States

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Description based upon print version of record.



2.

Record Nr.

UNINA9910138915303321

Titolo

2009 10th Latin American Test Workshop

Pubbl/distr/stampa

[Place of publication not identified], : IEEE, 2009

ISBN

9781509069293

1509069291

9781424442065

1424442060

Descrizione fisica

1 online resource (221 pages)

Disciplina

621.3810287

Soggetti

Electronic apparatus and appliances - Testing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph

Sommario/riassunto

The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault.