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1. |
Record Nr. |
UNINA9910818213003321 |
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Titolo |
Safety and security of commercial spent nuclear fuel storage : public report / / Committee on the Safety and Security of Commercial Spent Nuclear Fuel Storage, National Research Council |
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Pubbl/distr/stampa |
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Washington, District of Columbia : , : National Academies Press, , 2006 |
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©2006 |
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ISBN |
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Descrizione fisica |
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1 online resource (127 p.) |
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Disciplina |
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Soggetti |
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Spent reactor fuels - Storage |
Plutonium - Recycling |
Radioactive waste disposal - United States |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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2. |
Record Nr. |
UNINA9910138915303321 |
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Titolo |
2009 10th Latin American Test Workshop |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2009 |
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ISBN |
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9781509069293 |
1509069291 |
9781424442065 |
1424442060 |
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Descrizione fisica |
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1 online resource (221 pages) |
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Disciplina |
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Soggetti |
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Electronic apparatus and appliances - Testing |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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Sommario/riassunto |
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The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault. |
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