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Record Nr. |
UNINA9910816501503321 |
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Autore |
Goodhew Peter J |
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Titolo |
Electron microscopy and analysis / / Peter J. Goodhew, John Humphreys, Richard Beanland |
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Pubbl/distr/stampa |
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London, : Taylor & Francis, 2001 |
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ISBN |
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0-429-17625-2 |
1-4822-8934-2 |
1-4200-1725-X |
1-282-77797-1 |
9786612777974 |
0-203-18425-4 |
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Edizione |
[3rd ed.] |
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Descrizione fisica |
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1 online resource (262 p.) |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction |
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
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Sommario/riassunto |
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"Electron Microscopy and Analysis deals with several sophisticated |
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