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1. |
Record Nr. |
UNINA9910814841403321 |
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Titolo |
African re-genesis : confronting social issues in the diaspora / / edited by Jay B. Haviser and Kevin C. MacDonald |
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Pubbl/distr/stampa |
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London : , : Routledge, , 2016 |
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ISBN |
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1-315-43536-5 |
1-315-43537-3 |
1-59874-780-0 |
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Descrizione fisica |
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1 online resource (291 p.) |
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Collana |
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Altri autori (Persone) |
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HaviserJay B |
MacDonaldKevin C |
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Disciplina |
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Soggetti |
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African diaspora |
Slavery - Africa |
Africa Civilization |
Africa History |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Correct series no. from publisher's Web site. |
First published 2006 by Left Coast Press, Inc. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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pt. 1. Heritage and contemporary identities -- pt. 2. Historical and anthropological perspectives -- pt. 3. Archaeology and living communities -- pt. 4. Slavery in Africa : other diasporas. |
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Sommario/riassunto |
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Ripped from motherland and family, ethnically mixed to quell the potential of uprisings, and brutalized by regimes of hard labor, the heart - the spirit - of Africa did not stop beating in the New World. Rather, it survived and has re-emerged; changed by contacts with new cultures and environments, but still part of the continuum of African tradition: an African Re-Genesis. This is the first volume in its field to emphasize the interdisciplinary temporal and geographic comparative research of Archaeology, Anthropology, History and Linguistics to allow us to form unique perspectives on bro |
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2. |
Record Nr. |
UNINA9910299940003321 |
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Autore |
Zhuang Yuming |
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Titolo |
Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements / / by Yuming Zhuang, Degang Chen |
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Pubbl/distr/stampa |
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Cham : , : Springer International Publishing : , : Imprint : Springer, , 2018 |
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ISBN |
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Edizione |
[1st ed. 2018.] |
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Descrizione fisica |
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1 online resource (176 pages) |
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Disciplina |
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Soggetti |
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Electronic circuits |
Electronics |
Microelectronics |
Circuits and Systems |
Electronic Circuits and Devices |
Electronics and Microelectronics, Instrumentation |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di contenuto |
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Chapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary. |
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Sommario/riassunto |
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This book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to |
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improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost. |
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