Low voltage electron microscopy : principles and applications / / edited by David C. Bell and Natasha Erdman

• Record Nr.: UNINA9910809297503321
• Pubbl/distr/stampa: Hoboken, : John Wiley & Sons Inc., 2013
• ISBN: 1-118-49851-8; 1-118-49848-8; 1-299-18823-0; 1-118-49850-X
• Edizione: [1st edition]
• Descrizione fisica: 1 online resource (257 p.)
• Collana: Royal Microscopical Society-John Wiley series
• Classificazione: SCI047000
• Altri autori (Persone): BellD. C (David C.); ErdmanNatasha
• Disciplina: 502.8/25
• Soggetti: Electron microscopy - Technique
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Description based upon print version of record.
• Nota di bibliografia: Includes bibliographical references and index.
• Nota di contenuto: Cover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; References; Chapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; References; Chapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation ; Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging; 5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 Summary; AcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index
• Sommario/riassunto: "Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--