1.

Record Nr.

UNISALENTO991002440119707536

Autore

Sborgia, Carlo

Titolo

Malattie dell'apparato visivo / Carlo Sborgia, Nicola Delle Noci ; presentazione del prof. Giuseppe Scuderi

Pubbl/distr/stampa

Padova : Piccin, [2004]

ISBN

9788829916900

Descrizione fisica

xiii, 286 p. : ill. ; 28 cm

Classificazione

LC RE46

617.7

Altri autori (Persone)

Delle Noci, Nicolaauthor

Scuderi, Giuseppe

Disciplina

617.7

Soggetti

Eye - Diseases

Eye - Pathophysiology

Ophthalmology

Lingua di pubblicazione

Italiano

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Includes analytical index (pp.[279]-286)



2.

Record Nr.

UNINA9910797805803321

Autore

Sahay Amar

Titolo

Managing and improving quality : integrating quality, statistical methods and process control / / Amar Sahay

Pubbl/distr/stampa

New York, New York (222 East 46th Street, New York, NY 10017) : , : Business Expert Press, , 2016

ISBN

1-63157-342-X

Edizione

[First edition.]

Descrizione fisica

1 online resource (xii, 288 pages)

Collana

Supply and operations management collection, , 2156-8200

Disciplina

658.562

Soggetti

Quality of products

Quality control

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di bibliografia

Includes bibliographical references (page [281]) and index.

Nota di contenuto

1. Introduction to quality -- 2. Quality programs in use today: Lean Six Sigma and total quality management -- 3. Statistical methods used in quality -- 4. Making inferences about process quality -- 5. Process variation, how it affects product quality -- 6. Control charts: fundamentals and concepts -- 7. Control charts for variables -- 8. Control charts for attributes -- 9. Process capability analysis -- 10. Summary, applications, and computer implementation -- Appendix A. Standard normal distribution table -- Appendix B. Partial t-distribution table -- Appendix C. Table of control chart constants -- Bibliography -- Index.

Sommario/riassunto

Quality is a discipline that focuses on product and service excellence. This book is about improving the quality of products and services. The improved quality and reliability lead to higher perceived value and increased market share for a company, thereby increasing revenue and profitability. The book discusses the concepts and dimensions of quality, costs of poor quality, the importance of quality in this highly competitive global economy, and quality programs--Six Sigma and Lean Six Sigma that focus on improving quality in industries. The text integrates quality concepts, statistical methods, and one of the major tools of quality--Statistical Process Control (SPC)--a major part of Six Sigma control phase. A significant part of the book is devoted to process control and the tools of SPC--control charts--used for



monitoring, controlling, and improving the processes by identifying the causes of process variation. The fundamentals of control charts, along with SPC techniques for variables and attributes, and process capability analysis and their computer applications are discussed in detail. This book fills a gap in this area by showing the readers comprehensive and step-wise solutions to model and solve quality problems using computers.

3.

Record Nr.

UNINA9910674007403321

Autore

Di Donato Loreto

Titolo

Microwave Imaging and Electromagnetic Inverse Scattering Problems

Pubbl/distr/stampa

MDPI - Multidisciplinary Digital Publishing Institute, 2020

ISBN

3-03921-951-0

Descrizione fisica

1 online resource (170 p.)

Soggetti

History of engineering and technology

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

Microwave imaging techniques allow for the development of systems that are able to inspect, identify, and characterize in a noninvasive fashion under different scenarios, ranging from biomedical to subsurface diagnostics as well as from surveillance and security applications to nondestructive evaluation. Such great opportunities, though, are actually severely limited by difficulties arising from the solution of the underlying inverse scattering problem. As a result, ongoing research efforts in this area are devoted to developing inversion strategies and experimental apparatus so that they are as reliable and accurate as possible with respect to reconstruction capabilities and resolution performance, respectively. The intent of this Special Issue is to present the experiences of leading scientists in the electromagnetic inverse scattering community, as well as to serve as an assessment tool for people who are new to the area of microwave imaging and electromagnetic inverse scattering problems.