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1. |
Record Nr. |
UNISALENTO991002440119707536 |
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Autore |
Sborgia, Carlo |
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Titolo |
Malattie dell'apparato visivo / Carlo Sborgia, Nicola Delle Noci ; presentazione del prof. Giuseppe Scuderi |
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Pubbl/distr/stampa |
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ISBN |
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Descrizione fisica |
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xiii, 286 p. : ill. ; 28 cm |
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Classificazione |
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Altri autori (Persone) |
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Delle Noci, Nicolaauthor |
Scuderi, Giuseppe |
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Disciplina |
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Soggetti |
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Eye - Diseases |
Eye - Pathophysiology |
Ophthalmology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Includes analytical index (pp.[279]-286) |
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2. |
Record Nr. |
UNINA9910797805803321 |
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Autore |
Sahay Amar |
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Titolo |
Managing and improving quality : integrating quality, statistical methods and process control / / Amar Sahay |
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Pubbl/distr/stampa |
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New York, New York (222 East 46th Street, New York, NY 10017) : , : Business Expert Press, , 2016 |
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ISBN |
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Edizione |
[First edition.] |
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Descrizione fisica |
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1 online resource (xii, 288 pages) |
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Collana |
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Supply and operations management collection, , 2156-8200 |
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Disciplina |
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Soggetti |
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Quality of products |
Quality control |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Nota di bibliografia |
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Includes bibliographical references (page [281]) and index. |
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Nota di contenuto |
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1. Introduction to quality -- 2. Quality programs in use today: Lean Six Sigma and total quality management -- 3. Statistical methods used in quality -- 4. Making inferences about process quality -- 5. Process variation, how it affects product quality -- 6. Control charts: fundamentals and concepts -- 7. Control charts for variables -- 8. Control charts for attributes -- 9. Process capability analysis -- 10. Summary, applications, and computer implementation -- Appendix A. Standard normal distribution table -- Appendix B. Partial t-distribution table -- Appendix C. Table of control chart constants -- Bibliography -- Index. |
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Sommario/riassunto |
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Quality is a discipline that focuses on product and service excellence. This book is about improving the quality of products and services. The improved quality and reliability lead to higher perceived value and increased market share for a company, thereby increasing revenue and profitability. The book discusses the concepts and dimensions of quality, costs of poor quality, the importance of quality in this highly competitive global economy, and quality programs--Six Sigma and Lean Six Sigma that focus on improving quality in industries. The text integrates quality concepts, statistical methods, and one of the major tools of quality--Statistical Process Control (SPC)--a major part of Six Sigma control phase. A significant part of the book is devoted to process control and the tools of SPC--control charts--used for |
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monitoring, controlling, and improving the processes by identifying the causes of process variation. The fundamentals of control charts, along with SPC techniques for variables and attributes, and process capability analysis and their computer applications are discussed in detail. This book fills a gap in this area by showing the readers comprehensive and step-wise solutions to model and solve quality problems using computers. |
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3. |
Record Nr. |
UNINA9910674007403321 |
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Autore |
Di Donato Loreto |
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Titolo |
Microwave Imaging and Electromagnetic Inverse Scattering Problems |
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Pubbl/distr/stampa |
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MDPI - Multidisciplinary Digital Publishing Institute, 2020 |
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ISBN |
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Descrizione fisica |
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1 online resource (170 p.) |
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Soggetti |
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History of engineering and technology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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Microwave imaging techniques allow for the development of systems that are able to inspect, identify, and characterize in a noninvasive fashion under different scenarios, ranging from biomedical to subsurface diagnostics as well as from surveillance and security applications to nondestructive evaluation. Such great opportunities, though, are actually severely limited by difficulties arising from the solution of the underlying inverse scattering problem. As a result, ongoing research efforts in this area are devoted to developing inversion strategies and experimental apparatus so that they are as reliable and accurate as possible with respect to reconstruction capabilities and resolution performance, respectively. The intent of this Special Issue is to present the experiences of leading scientists in the electromagnetic inverse scattering community, as well as to serve as an assessment tool for people who are new to the area of microwave imaging and electromagnetic inverse scattering problems. |
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