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Record Nr. |
UNINA9910788564003321 |
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Autore |
Oku Takeo |
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Titolo |
Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / / Takeo Oku |
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Pubbl/distr/stampa |
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Berlin, [Germany] ; ; Boston, [Massachusetts] : , : De Gruyter, , 2014 |
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©2014 |
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ISBN |
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1-5231-0054-0 |
3-11-038804-9 |
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Descrizione fisica |
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1 online resource (180 p.) |
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Disciplina |
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Soggetti |
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Transmission electron microscopy |
High resolution electron microscopy |
Nanostructured materials |
Structural analysis (Engineering) |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references at the end of each chapters and index. |
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Nota di contenuto |
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Front matter -- Preface -- Contents -- 1 Introduction -- 2 Structure and principle of electron microscopes -- 3 Practice of HREM -- 4 Characterization by HREM -- 5 Electron diffraction analysis of nanostructured materials -- 6 HREM analysis of nanostructured materials -- A Appendix -- Index |
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Sommario/riassunto |
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High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. |
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