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1. |
Record Nr. |
UNINA9910151841903321 |
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Titolo |
Aufklärung und Esoterik / / herausgegeben von Monika Neugebauer-Wölk ; unter Mitarbeit von Holger Zaunstöck |
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Pubbl/distr/stampa |
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Hamburg, Germany : , : Felix Meiner Verlag, , 1999 |
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©1999 |
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ISBN |
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Descrizione fisica |
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1 online resource (490 pages) |
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Collana |
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Studien zum achtzehnten Jahrhundert ; ; Band 24 |
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Disciplina |
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Soggetti |
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Enlightenment |
Occultism - Europe - History - 18th century |
Philosophy, Modern - 18th century |
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Lingua di pubblicazione |
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Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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2. |
Record Nr. |
UNINA9910787498103321 |
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Titolo |
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA / / organized by Electronic Device Failure Analysis Society, ASM International |
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Pubbl/distr/stampa |
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Materials Park, Ohio : , : ASM International, , 2014 |
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©2014 |
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ISBN |
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1-62708-075-9 |
1-68015-514-8 |
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Descrizione fisica |
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1 online resource (560 p.) |
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Disciplina |
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Soggetti |
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Electronics - Materials - Testing |
Electronic apparatus and appliances - Testing |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Nota di contenuto |
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""Title Page""; ""TitlePage_2014""; ""COPYRight Page""; ""EDFAS 2014 Board of Directors""; ""Organizing Committee-2014""; ""Technical Program Committee - 2014""; ""Contents_2014""; ""ISTFA2014_Combined""; ""cp2014istfa001""; ""cp2014istfa005""; ""cp2014istfa006""; ""cp2014istfa012""; ""cp2014istfa023""; ""cp2014istfa028""; ""cp2014istfa033""; ""cp2014istfa038""; ""cp2014istfa043""; ""cp2014istfa049""; ""cp2014istfa055""; ""cp2014istfa065""; ""cp2014istfa073""; ""cp2014istfa082""; ""cp2014istfa087""; ""cp2014istfa094""; ""cp2014istfa100""; ""cp2014istfa105""; ""cp2014istfa110"" |
""cp2014istfa115""""cp2014istfa125""; ""cp2014istfa130""; ""cp2014istfa136""; ""cp2014istfa143""; ""cp2014istfa148""; ""cp2014istfa152""; ""cp2014istfa156""; ""cp2014istfa166""; ""cp2014istfa172""; ""cp2014istfa178""; ""cp2014istfa184""; ""Combined_189-536""; ""Analysis of InGaAs Epi Defects by Conductive AFM""; ""Failure analysis of bit line to SNC leakage fail in 2xnm DRAM using Nano- Probing technique""; ""Analysis of an Anomalous CMOS Transistor Exhibiting Drain to Source Leakage � Its Model and Cause""; ""Feature Based Non-Destructive Fault Isolation in Advanced IC |
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Packages"" |
""Understanding the Cu Void Formation by TEM Failure Analysis""""microPREPTM - A New Laser Tool for High-Throughput Sample Preparation""; ""Using Energy Dispersive Spectroscopy (EDS) to Determine the Resistance of FIB Jumpers for Circuit Edit""; ""New Ion Source for High Precision FIB Nanomachining and Circuit Edit""; ""Evaluation of Power SiC-MOSFET Using Super-Higher-Order Scanning Nonlinear Dielectric Microscopy: Imaging of Carrier Distribution and Depletion Layer""; ""Imaging Performance of aSIL Microscopy on Subsurface Imaging of SOI Chips"" |
""Methods to Reconstruct SEM and Optical Probe Tips using a FIB Tool""""Near-Field Scanning Optical Microscopy for Through-Silicon Imaging and Fault Isolation of Integrated Circuits""; ""Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation""; ""Continuous-wave 1064nm laser for Laser Voltage Imaging and Probing Applications""; ""Marginal Failure Diagnosed with LADA: Case Studies.""; ""Sample Preparation for High Numerical Aperture Solid Immersion Lens Laser Imaging""; ""TDR Analysis On Short Transmission Lines"" |
""Productive Polishing TEM Sample Preparation Methodology Development""""Optimization of TEM Sample Preparation to Reduce the Overlapping of TEM Images""; ""Delayering on Advanced Process Technologies using FIB""; ""Failure Analysis Enhancement by Incorporating a Compact Scan Diagnosis System""; ""Debugging Phase-Locked Loop Failures in Integrated Circuit Products""; ""A Novel Method for the Specified Site Planar View TEM Sample Preparation""; ""Investigation of Protection Layer Materials for Ex-situ �lift-out� TEM Sample Preparation with FIB for 14nm FinFET"" |
""Localization of weak points in thin dielectric layers by Electron Beam Absorbed Current (EBAC) Imaging"" |
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3. |
Record Nr. |
UNINA9910970237803321 |
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Autore |
Williams Donna <1963-> |
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Titolo |
The jumbled jigsaw : an insider's approach to the treatment of autistic spectrum 'fruit salads' / / Donna Williams |
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Pubbl/distr/stampa |
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Philadelphia, : Jessica Kingsley Publishers, 2006 |
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ISBN |
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9786610566310 |
9781280566523 |
1280566523 |
9781846424618 |
1846424615 |
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Edizione |
[1st ed.] |
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Descrizione fisica |
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1 online resource (394 p.) |
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Disciplina |
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Soggetti |
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Autism - Alternative treatment |
Autism |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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COVER; The Jumbled Jigsaw; Contents; part 1Getting Oriented; Introduction; part 2 Into theh Depths; 1 Fuel System and Electrical Problems; 2Different Waysof Navigating the World; 3Issues of Overload; 4Experiencing the WorldRather Differently; 5Losing Control of One's Body; 6Strange Emotional Spaces; 7Invisible Cages; 8Being Joined at the Hip; 9Bad Parenting or Bad Match?; 10A Matter of Perspective; 11Who Am Iand Which Side Am I On?; part 3The Fallout; 12The Fallout; Appendix 1 Sources of Help: Professionals, Places and Services; Appendix 2 Autism Spectrum Cluster Checklist |
Appendix 3 Referral List Based on ChecklistReferences; Index |
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Sommario/riassunto |
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This book exposes autism spectrum disorders as a combination of a whole range of often underlying conditions. Exploring everything from mood, anxiety, obsessive-compulsive and tic disorders to information processing and sensory perceptual difficulties and more, Donna demonstrates how such conditions can combine to form a 'cluster condition'. |
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