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1. |
Record Nr. |
UNISA996385825803316 |
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Autore |
Rider Cardanus |
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Titolo |
Riders 1690 British Merlin [[electronic resource] ] : bedeckt with many delightful varieties and useful verities, fitting the longitude and latitude of all capacities within the islands of Great Britain's monarchy : with chronological observations of principal note to this year 1660, being the second from bissextile or leap-year : to which is added the sun and moons rising & setting : also, useful notes of husbandry, physick, fayrs & marts, and directions & tables to all necessary uses / / made and compiled for the benefit of his country by Cardanus Riders |
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Pubbl/distr/stampa |
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London, : Printed by Tho. Newcomb for the Company of Stationers, 1686 |
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Descrizione fisica |
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Soggetti |
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Almanacs, English |
Ephemerides |
Astrology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Numerous blank pages containing manuscript notes between p. [12-62]. |
Imperfect: pages cropped, faded and stained with slight loss of print. |
Reproduction of original in the Bodleian Library. |
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Sommario/riassunto |
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2. |
Record Nr. |
UNINA9910785116003321 |
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Autore |
Moreira José <1975-> |
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Titolo |
An engineer's guide to automated testing of high-speed interfaces / / José Moreira, Hubert Werkmann |
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Pubbl/distr/stampa |
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Boston : , : Artech House, , ©2010 |
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[Piscataqay, New Jersey] : , : IEEE Xplore, , [2010] |
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ISBN |
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Descrizione fisica |
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1 online resource (590 p.) |
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Collana |
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Artech House microwave library |
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Altri autori (Persone) |
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Disciplina |
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Soggetti |
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Very high speed integrated circuits |
Automatic test equipment |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Description based upon print version of record. |
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Nota di bibliografia |
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Includes bibliographical references and index. |
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Nota di contenuto |
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An Engineer's Guide to Automated Testing of High-Speed Interfaces; Contents; Preface; Acknowledgments; 1 Introduction; 2 High-Speed Digital BasicsThis; 3 High-Speed Interface Standards; 4 ATE Instrumentation for DigitalApplications; 5 Tests and Measurements; 6 Production Testing; 7 Support Instrumentation; 8 Test Fixture Design; 9 Advanced ATE Topics; A Introduction to the Gaussian Distribution and Analytical Computation of the BER; B The Dual Dirac Model and RJ/DJ Separation; C Pseudo-Random Bit Sequences and Other Data Patterns; D Coding, Scrambling, Disparity,and CRC |
E Time Domain Reflectometry andTime Domain Transmission(TDR/TDT)F S-Parameters; G Engineering CAD Tools; H Test Fixture Evaluation andCharacterization; I Jitter Injection Calibration; About the Authors; Index |
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Sommario/riassunto |
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Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book to focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses advanced ATE |
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topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches. |
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