|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910777360903321 |
|
|
Autore |
Goodhew Peter J. |
|
|
Titolo |
Electron Microscopy and Analysis, Third Edition / / Peter J. Goodhew, John Humphreys, Richard Beanland |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
Boca Raton, FL : , : CRC Press, , 2014 |
|
|
|
|
|
|
|
ISBN |
|
0-429-17625-2 |
1-4822-8934-2 |
1-4200-1725-X |
1-282-77797-1 |
9786612777974 |
0-203-18425-4 |
|
|
|
|
|
|
|
|
Edizione |
[3rd edition.] |
|
|
|
|
|
Descrizione fisica |
|
1 online resource (262 p.) |
|
|
|
|
|
|
Disciplina |
|
|
|
|
|
|
|
|
Soggetti |
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Note generali |
|
Description based upon print version of record. |
|
|
|
|
|
|
Nota di bibliografia |
|
Includes bibliographical references and index. |
|
|
|
|
|
|
Nota di contenuto |
|
Book Cover; Title; Contents; Acronyms; Preface; Microscopy with light and electrons; Methods of image formation; Pixels; The light-optical microscope; Magnification; Resolution; Depth of field and depth of focus; Aberrations in optical systems; Electrons versus light; Questions; Electrons and their interaction with the specimen; Generating a beam of electrons; Deflection of electrons magnetic lenses; The scattering of electrons by atoms; Elastic scattering; Inelastic scattering; Secondary effects; The family of electron microscopes; Questions; Electron diffraction |
The geometry of electron diffractionDiffraction spot patterns; Use of the reciprocal lattice in diffraction analysis; Other types of diffraction pattern; Questions; The transmission electron microscope; Contrast mechanisms; High voltage electron microscopy (HVEM); Scanning transmission electron microscopy (STEM); Questions; The scanning electron microscope; Obtaining a signal in the SEM; The optics of the SEM; The performance of the SEM; The ultimate resolu |
|
|
|
|
|
|
|
|
Sommario/riassunto |
|
"Electron Microscopy and Analysis deals with several sophisticated |
|
|
|
|