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Record Nr. |
UNINA9910712920003321 |
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Titolo |
Ellipsometry in the measurement of surfaces and thin films : symposium proceedings |
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Pubbl/distr/stampa |
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Washington : , : U.S. National Bureau of Standards, , 1964 |
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Descrizione fisica |
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1 online resource (vi, 359 pages) : illustrations |
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Collana |
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National Bureau of Standards miscellaneous publication ; ; 256 |
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Disciplina |
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Soggetti |
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Polarization (Light) |
Surfaces (Technology) |
Thin films |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
Edited by E. Passaglia, R.R. Strombery, and J. Kruger. |
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Nota di bibliografia |
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Includes bibliographical references. |
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