Sensitivity analysis for biometric systems : a methodology based on orthogonal experiment designs / / Yooyoung Lee; Ross J. Micheals; P. Jonathon Phillips; James J. Filliben
Pubbl/distr/stampa
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2012
Descrizione fisica
1 online resource
Collana
NISTIR ; ; 7855
Altri autori (Persone)
FillibenJames J
LeeYooyoung
MichealsRoss J
PhillipsP. Jonathon
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Note generali
2012.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.