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Record Nr. |
UNINA9910710078503321 |
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Autore |
Humphreys Jimmy C |
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Titolo |
Measurement of depth-dose distributions in carbon, aluminum, polyethylene, and polystyrene for 10-MEV incident electrons / / J. C. Humphreys; S. E. Chappell; W. L. McLaughlin; R. D. Jarrett |
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Pubbl/distr/stampa |
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1973 |
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Descrizione fisica |
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Collana |
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Altri autori (Persone) |
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ChappellS. E. <1931-2007.> |
HumphreysJimmy C |
JarrettR. D |
McLaughlinWilliam L |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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1973. |
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
Title from PDF title page. |
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Nota di bibliografia |
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Includes bibliographical references. |
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