The application of test structures and test patterns to the development of radiation hardened integrated circuits : a review / / K. F. Galloway; M. G. Buehler
Pubbl/distr/stampa
Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1976
Descrizione fisica
1 online resource
Collana
NBSIR ; ; 76-1093
Altri autori (Persone)
BuehlerM. G
GallowayK. F
Lingua di pubblicazione
Inglese
Formato
Materiale a stampa
Livello bibliografico
Monografia
Note generali
1976.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.