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Record Nr. |
UNINA9910702878303321 |
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Autore |
Kempe Michael D |
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Titolo |
Stress induced degradation modes in CIGSS minimodules [[electronic resource] /] / Mike Kempe, Kent Terwilliger, and Dale Tarrant |
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Pubbl/distr/stampa |
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Golden, CO : , : National Renewable Energy Laboratory, , [2008] |
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Descrizione fisica |
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18 unnumbered slides : digital, PDF file |
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Collana |
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Altri autori (Persone) |
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TerwilligerKent |
TarrantD. E (Dale E.) |
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Soggetti |
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Photovoltaic cells - Research |
Solar cells - Testing |
Conference papers and proceedings. |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed Apr. 16, 2009). |
"Presented at the 33rd IEEE Photovoltaic Specialist[s] Conference held May 11-16, 2008 in San Diego, California." |
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