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Record Nr. |
UNINA9910702249303321 |
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Titolo |
Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate [[electronic resource] /] / Hyun Jung Kim ... [and others] |
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Pubbl/distr/stampa |
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Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2012] |
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Descrizione fisica |
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1 online resource (ix, 29 pages) : illustrations (some color) |
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Collana |
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Altri autori (Persone) |
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Soggetti |
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Ion beams |
Sapphire |
Transmission electron microscopy |
X ray diffraction |
Single crystals |
Rhombohedrons |
Germanium |
Density measurement |
Crystal structure |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed on Nov. 7, 2012). |
"August 2012." |
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Nota di bibliografia |
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Includes bibliographical references (page 29). |
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