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Record Nr. |
UNINA9910699506403321 |
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Autore |
Shue John L |
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Titolo |
Power MOSFET thermal instability operation characterization support [[electronic resource] /] / John L. Shue and Henning W. Leidecker |
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Pubbl/distr/stampa |
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Hampton, Va. : , : National Aeronautics and Space Administration, Langley Research Center, , [2010] |
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Descrizione fisica |
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1 online resource (iv, 16 pages) : illustrations |
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Collana |
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Altri autori (Persone) |
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Soggetti |
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Metal oxide semiconductors |
Field effect transistors |
Thermal instability |
Charge carriers |
Ground support equipment |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Title from title screen (viewed on Nov. 8, 2010). |
"April 2010." |
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Nota di bibliografia |
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Includes bibliographical references (page 16) |
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